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Recommended Citation: Sockel, H, K Chen, and J W Kroeger.  Technological Adoption to Combat Burnout.  In The Proceedings of the Information Systems Education Conference 2001, v 18 (Cincinnati): §15b.

Technological Adoption to Combat Burnout

Hy Sockel    [a1] [a2]
Williamson College of Business Administration
Youngstown State University    [u1] [u2]
Youngstown, Ohio, USA    [c1] [c2]

Kuanchin Chen    [a1] [a2]
Haworth College of Business
Western Michigan University    [u1] [u2]
Kalamazoo, Michigan, USA    [c1] [c2]

James W. Kroeger    [a1] [a2]
Nance College of Business
Cleveland State University    [u1] [u2]
Cleveland, Ohio, USA    [c1] [c2]

This study examines issues relating to retention of Information Systems and Technology (IS&T) employees. A survey of over 250 Information Systems and Technology professionals indicates that "loyalty issues" have a higher impact on employee retention than do the traditional constructs of job satisfaction and organizational commitment. Path Analysis was used to investigate the role of job satisfaction, employee commitment, organizational loyalty and job burnout as it impacts employee retention.

Keywords: information systems employee, turnover, burnout, job satisfaction, loyalty

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